CMOS - CD4011, 2-Input CMOS NAND Gates, 14-Pin DIP

CMOS - CD4011, 2-Input CMOS NAND Gates, 14-Pin DIP

CMOS - CD4011, 2-Input CMOS NAND Gates, 14-Pin DIP image 1
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CD4011B NAND gates provide the system designer with direct implementation of the NAND function and supplement the existing family of CMOS gates. All inputs and outputs are buffered.

Features:

  • Propagation delay time = 60 ns (typ.) at CL = 50 pF, VDD = 10 V
  • Buffered inputs and outputs
  • Standardized symmetrical output characteristics
  • Maximum input current of 1 µA at 18 V over-full package temperature range; 100 nA at 18 V and 25°C
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Noise margin (over full package temperature range:
    • 1 V at VDD = 5 V
    • 2 V at VDD = 10 V
    • 2.5 at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of "B" Series CMOS Devices"
SKU:
P-QCD4011
Item ID:
046928
Texas Instruments Part Number:
CD4011BE
Package:
Sections:
RoHS Compliant
Data rate (Max) (Mbps)8
FeaturesStandard speed (tpd > 50ns)
IOH (Max) (mA)-6.8
IOL (Max) (mA)6.8
Inputs per channel2
Input typeStandard CMOS
Number of channels4
Output typePush-Pull
RatingCatalog
Supply voltage (Max) (V)18
Supply voltage (Min) (V)3
Technology familyCD4000
Packaging Information
Packaging Dimensions0.775 in. × 0.35 in. × 0.3 in.
Weight (Packaging)0.0022 lbs.
PDF: DatasheetAll Models

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PDF: Datasheet Datasheet888.44 KB
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